Plasma FIB/SEM for room-temperature and cryogenic applications

Reasons given by the contracting authority

Aufgrund der Eignungs- und Zuschlagskriterien der Spezifikation geht der Zuschlag an die Firma FEI Europe B.V. , da sie gemäss Evaluation das vorteilhafteste Angebot eingereicht hat. Beim Zuschlagskriterium Preis hat sie das tiefste Angebot eingereicht und zudem die technische Spezifikation vollständig erfüllt.

Description

The new plasma-focused ion beam/scanning electron microscope to be offered will be shared for applications under cryogenic (frozen biological materials and battery materials) as well as under room temperature conditions (all types of materials). Therefore, it must be fully room temperature as well as cryo-compatible and also allow for vacuum/inert gas transfer. Its main applications will be the preparation of TEM lamellae and of pillars for X-ray investigations at the synchrotron. Material investigations (SEM imaging; FIB cross-sections), 3D FIB tomography and prototyping will be additional important topics. A fluorescence light microscope and energy dispersive X-ray spectroscopy will complement the capabilities of the instrument.