Scanning electron microscope for imaging and quantitative analysis in geological samples

Description

The Institute of Geochemistry and Petrology at ETH Zürich is seeking to upgrade its existing analytical scanning electron microscope (SEM) for a new SEM equipped with a field emission gun, secondary electrons detector (SE) and high-performance backscattered electron detectors (BSE), and a state-of-the-art large area (≥ 100 mm2) energy dispersive spectrometer (EDS). Among several options, we welcome offers for panchromatic and/or entry-level monochromatic cathodoluminescence detector. The main goal of this instrument will be to provide precise and accurate quantitative analyses by EDS using a rigorous quantification protocol that includes the use of reference materials and a full matrix correction (ZAF, phi-rho-z, or equivalent). The instrument should have a large chamber to allow a minimum of 3 petrographic thin sections and 6 one-inch epoxy round mounts. It should be programmable so that we run series of >24 hours of automated quantitative EDS analyses. For further details, please refer to the specifications.